Scanning electron microscope JEOL JSM-5500LV / EDX microanalyser - IXRF Systems (detector GRESHAM Sirius 10)
The X-ray microanalysis is non-invasive and can be performed in a volume of µm3 order of magnitude. The diameter of the area analysed can be from 0.05 µm to 5 mm. It is able to find and determine the elements with atomic numbers from 5 to 92 (from boron to uranium).
Contact person:
Ing. Zuzana Zmrhalová, Ph.D. (zuzana.zmrhalova@upce.cz )
Ing. Jan Smolík, Ph.D. ( jan.smolik@upce.cz )
Phone: 46 603 6151
BX 60 OLYMPUS with heating stage THMS 600 LINKAM
Magnification 50 – 500x. Light source (100 W halogen lamp) works in both transmittedand reflex mode. Bright filed, dark field and polarized technique is available. Optical stage can be easily changed by heating stage. Heating stage is supplied by programmable unit with possibility of regulation in the temperature range – 196 - +600 oC; available heating rate 0.01 – 130 oC/min. Isothermal regime allows nine different ramps. Optical microscope is connected with computer, camera and CCD camera.
Contact person:
doc. Ing. Eva Čenošková, CSc. (eva.cernoskova@upce.cz)
Phone: 46 603 6154
Differential Scanning Calorimetry (Power - compensated), Diamond DSC (Perkin-Elmer)
- Temperature range -70 – 600 oC.
- Available heating/cooling rates 0.5 – 50 oC/min.
- Measurement is performed in alumina pans
Differential Scanning Calorimetry (Heat - Flow) , DSC 12E (Mettler Toledo)
- Temperature range 25 – 400 oC.
- Available heating/cooling rates 1 - 20 oC/min.
- Measurement is performed in alumina pans.
Differential thermal analysis (DTA), DTA-RMI 03
- Temperature range 25 – 850 oC.
- Available heating/cooling rates 1 - 50 oC/min.
- Measurement is performed in evacuated sealed quartz ampoules.
- The method is suitable for determining the crystallization and melting points.
Contact person:
doc. Ing. Eva Čenošková, CSc. (eva.cernoskova@upce.cz)
Phone: 46 603 6154
Thermomechanical analyzer, TMA CX 03RA-T (R.M.I.)
- Temperature range 30 – 800 oC.
- Available heating/cooling rates 0.1 – 20 oC/min.
- Available loading force 0.1 - 1000 mN
- The method is suitable for viscosity and photoinduced changes in viscous flow measurement, determination of glass transition temperature, dilatation softening temperature, coefficients of thermal expansion, and melting temperature
Contact person:
Ing. Zuzana Zmrhalová, Ph.D. (zuzana.zmrhalova@upce.cz )
Phone: 46 603 6151, 46 603 7446
Spin Coater Laurell WS-650Hzb-23NPPB-UD-3 (Laurell Technologies)
Spin coating is used for many applications where a flat substrate is coated with thin layers of materials. The coating solution is deposited onto the surface and spun-off to leave a uniform layer for subsequent processing stages or the ultimate use. The coating of a substrate with specific materials can be used to generate highly tailored surfaces for cell culture or to define structured surfaces and microfluidic devices.
The Laurell WS-650Hzb-23NPP-UD-3 spin coaters, accomodate up to 150 mm wafers and 5”x5” substrates. They are equipped with three automatic dispensers and feature a maximum rotation speed of 12.000 rpm and acceleration up to 30K rpm/sec. The control of the motor mode rotation (clockwise, counterclockwise, puddle), in combination with the three automatic dispensers, allows to obtain an uniform deposition of multilayer thin films and to perform photoresist development. These features enable a quick work optimization with fully automatic processes and high reproducibility.
Contact person:
Ing. Klára Melánová, Ph.D. (klara.melanova@upce.cz)
Phone: 46 603 6146
FT-IR spectometer, Nicolet NEXUS (FAR - NEAR IR, Thermo Fisher Scientific, USA) and Optical cryostat OptistatCF-V
Operating range: 6,000 to 50 cm-1 (0.9 μm to 0.2 mm)
Accessories:
- Specular and difuze reflectance
- Beam condenser (magnification 6x)
- Optical cryostat (-265 to +200 °C)
Contact person:
Ing. Petr Kutálek, Ph.D. (petr.kutalek@upce.cz)
Phone: 46 603 6155
UV-Vis spectrometer Cintra 2020 (GBC Scientific equipment, Australia)
Instrument with its wavelength range from 190 to 1200nm and very low stray light and noise specifications. Possibility to measure with selectable slit width in the range of 0.5 to 3 nm and scan speed up to 10,000 nm/min.
Contact person:
Ing. Petr Kutálek, Ph.D. (petr.kutalek@upce.cz)
Phone: 46 603 6155
The modular AFM instrument SPM (Scanning Probe Microscopy) microscope Solver PRO-M firmy NT-MDT (Russia) with AFM, AFAM, and STM
The SOLVER PRO-M model is suited for:
- Large XYZ scanning range (from atomic resolution up to 100 х 100 µm2) for samples of solids with maximal size of 100 x 20 mm2 or a dried suspension on a HOPG surface
- Integrated optical video system with resolution of 10 MPix
- Statistical values of roughness (RMS) and grains/pores analysis
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In ambient air:
- Topological image - STM (Scanning Tunnelling Microscopy)/ AFM (contact + non-contact + semicontact modes)
- Mapping of mechanical behaviour - Phase Imaging/ Force Modulation Mode/ AFAM (Atomic Force Acoustic Microscopy)/ Adhesion Force Imaging
- Mapping of electromagnetic behaviour -Spreading Resistance Imaging/ Magnetic Force Microscopy/ Electric Force Microscopy/ Kelvin Force Mode
- Applications: New materials/ Thin Film/ Polymers/ Semiconductors/ Defect detection/ Biological samples
Contact person:
Ing. Petr Kutálek, Ph.D. (petr.kutalek@upce.cz)
Phone: 46 603 6155
