Publication detail
Characterization of RF magnetron sputtered Ge2Sb2Te5 thin films towards PC RAM application.
Authors:
Gutwirth | Wágner Tomáš | Bezdička | Přikryl | Vlček Milan | Frumar Miloslav
Year: 2008
Type of publication: článek ve sborníku
Name of source: Proceedings of ICTF14 & RSD2008
Publisher name: Ghent University
Place: Ghent
Page from-to: 207-210
