Publication detail

Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films

Year: 2008

Type of publication: článek v odborném periodiku

Name of source: Thin Solid Films

Publisher name: Elsevier Science BV

Place: Amsterdam

Page from-to: 7511-7518

Titles:

Language	Name	Abstract	Keywords
cze	Srovnávací studium strukturálních změn indukovaných na povrchu tenké amorfní vrstvy As35S65 expozicí svazkem elektronů a fotony	Metodou rentgenové fotoelektronové spektroskopie byly studovány změny elektronové struktury a chemického složení na povrchu čerstvě napařených vrstev o složení As35S65 indukované expozicí elektrony a svakem fotonů a porovnán mechanismus těchto změn..	chalkogenidová skla; strukturální změny; tenké vrstvy
eng	Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films	Change of electronic structure and chemical composition on the surface of freshly prepared As35S65 thin films caused by electron- and light irradiation have been studied by high-resolution X-ray photoelectron spectroscopy. The mechanisms of the induced transformations are compared. It is shown that light irradiation causes redistribution of chemical bonds without change in chemical composition. The products of such lightinduced structural transformations were also identified by Raman spectroscopy in the volume of thin films. Electron irradiation changes chemical composition of the surface by creating an As-enriched layer due to the formation of As?O bonds. Anomalous increase of the ~10 eV band associated with non-bonding As 4s electrons was observed after light- and low dose e-beam irradiation.	chalcogenide glasses, structural transformations, thin films

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