Publication detail

Ge-Sb-Te (GST) thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study

Year: 2009

Type of publication: článek v odborném periodiku

Name of source: Journal of Applied Physics

Publisher name: American Institute of Physics

Place: Melville

Page from-to: 1035091-1035097

Titles:

Language	Name	Abstract	Keywords
cze	Tenké vrstvy Ge-Sb-Te (GST) deponované pulzním laserem: Elipsometrická studie a studie spektroskopií Ramanova rozptylu	Elipsometrií a Ramanovým rozptylem byly studovány tenké vrstvy Ge-Sb-Te (GST) deponované pulzním laserem.	pulzní laserová depozice; spektroskopická elipsometrie; Ramanův rozptyl; GST
eng	Ge-Sb-Te (GST) thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study	Ge-Sb-Te (GST) thin films deposited by pulsed laser were studied by ellipsometry and Raman scattering spectroscopy.	pulsed laser deposition; spectroscopic ellipsometry; Raman scattering; GST

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