Publication detail
Nano-scale annealing-induced structural changes in As-rich pulsed laser deposited AsxSe100-x films studied by XPS.
Authors:
Kalyva M. | Siokou A. | Yannopoulos SN | Němec Petr | Frumar Miloslav
Year: 2005
Type of publication: článek ve sborníku
Name of source: 21st International Conference on Amorphous and Nanocrystalline Semiconductors
Publisher name: Universidade Nova de Lisboa
Place: Lisbon, Portugal
Page from-to: 348
