Publication detail
Nano-scale annealing-induced structural changes in As-rich pulsed laser deposited AsxSe100-x films studied by XPS.
Authors:
Kalyva M. | Siokou A. | Yannopoulos SN | Němec Petr | Frumar Miloslav
Year:
2005
Type of publication:
článek ve sborníku
Name of source:
21st International Conference on Amorphous and Nanocrystalline Semiconductors
Publisher name:
Universidade Nova de Lisboa
Place:
Lisbon, Portugal
Page from-to:
348
