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Structure and optical properties of pulsed laser deposited Ge-Sb-Te thin films by Raman scattering spectroscopy and spectroscopic ellipsometry.
Authors: Němec Petr | Nazabal Virginie | Moreac Alain | Gutwirth Jan | Frumar Miloslav
Year: 2011
Type of publication: ostatní - přednáška nebo poster
Page from-to: nestránkováno
Titles:
Language Name Abstract Keywords
eng Structure and optical properties of pulsed laser deposited Ge-Sb-Te thin films by Raman scattering spectroscopy and spectroscopic ellipsometry. Structure and optical properties of pulsed laser deposited Ge-Sb-Te thin films were studied by Raman scattering spectroscopy and spectroscopic ellipsometry, respectively. Ge-Sb-Te; thin films; pulsed laser deposition; spectroscopic ellipsometry; Raman spectroscopy