University of PardubiceFaculty of Chemical Technology

University

Employees
|
Students
Česky

Publication detail

Thin films of Ge28-xGaxS72 and possibility of doping of Ag into them

Authors: Valkova Silvie | Wágner Tomáš | Bartoš Miroslav | Pavlišta Martin | Vlček Milan | Frumarová Božena | Beneš Ludvík | Frumar Miloslav

Year: 2012

Type of publication: ostatní do riv

Page from-to: nestránkováno

Titles:

Language	Name	Abstract	Keywords
cze	Thin films of Ge28-xGaxS72 and possibility of doping of Ag into them	Bulk samples with compositions Ge28S72, Ge26Ga2S72, Ge24Ga4S72 and Ge22Ga6S72 were prepared by direct synthesis from very pure elements. Four groups of thin films were prepared from these bulk samples. Two methods were used for the preparations, the pulsed laser deposition (PLD) with excimer laser and thermal evaporation with three different boxes. The samples of thin films were characterized by X-Ray diffraction analysis (XRD), Energy Dispersive X-Ray analysis (EDX), Raman spectroscopy, UV/VIS spectroscopy and Variable Angle Spectral Ellipsometry (VASE). The different methods of the preparation as well as the different evaporation boxes that were used led to many differences of the structure and optical properties of prepared thin films. Optically induced diffusion of Ag into the thin films prepared by PLD changed their properties even further.	chalkogenidové sklo; tenké vrstvy; Ag difůze; optické vlastnosti
eng	Thin films of Ge28-xGaxS72 and possibility of doping of Ag into them	Bulk samples with compositions Ge28S72, Ge26Ga2S72, Ge24Ga4S72 and Ge22Ga6S72 were prepared by direct synthesis from very pure elements. Four groups of thin films were prepared from these bulk samples. Two methods were used for the preparations, the pulsed laser deposition (PLD) with excimer laser and thermal evaporation with three different boxes. The samples of thin films were characterized by X-Ray diffraction analysis (XRD), Energy Dispersive X-Ray analysis (EDX), Raman spectroscopy, UV/VIS spectroscopy and Variable Angle Spectral Ellipsometry (VASE). The different methods of the preparation as well as the different evaporation boxes that were used led to many differences of the structure and optical properties of prepared thin films. Optically induced diffusion of Ag into the thin films prepared by PLD changed their properties even further.	chalcogenide glass; thin films; Ag diffusion; optical properties