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L3-edge XANES study of as-deposited and thermally crystallized GeTe-based phase-change memory alloys
Authors: Krbal Miloš
Year: 2012
Type of publication: ostatní do riv
Page from-to: nestránkováno
Titles:
Language Name Abstract Keywords
cze L3-edge XANES study of as-deposited and thermally crystallized GeTe-based phase-change memory alloys Using Ge-L3 edge XANES studies, we demonstrate a noticeable difference in the local structure between as-deposited amorphous and thermally crystalized GeTe-based phase change alloys. The pronounced changes appear as a step-like shoulder in the absorption edge, corresponding to 2p-5s and 4d electron transitions, and in overall spectrall shape above the edge where the XANES spectrum becomes featureless for the amorphous phase. XANES; chalkogenidy; paměťová slitina
eng L3-edge XANES study of as-deposited and thermally crystallized GeTe-based phase-change memory alloys Using Ge-L3 edge XANES studies, we demonstrate a noticeable difference in the local structure between as-deposited amorphous and thermally crystalized GeTe-based phase change alloys. The pronounced changes appear as a step-like shoulder in the absorption edge, corresponding to 2p-5s and 4d electron transitions, and in overall spectrall shape above the edge where the XANES spectrum becomes featureless for the amorphous phase. XANES; L3-edgeGETe-based alloys; chalcogenides