Publication detail

Utilization of various atomic force microscopy modes in the study of the layered materials

Year: 2013

Type of publication: ostatní - přednáška nebo poster

Page from-to: nestránkováno

Titles:

Language	Name	Abstract	Keywords
eng	Utilization of various atomic force microscopy modes in the study of the layered materials	There were reviewed a possibilities of the different modes of AFM for the study of the layered materials, processes of the synthesis and exfoliation to the nanosheets for the study of the topography, mechanical and electrical behavior.	atomic force microscopy; material engineering; layered material;

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