Publication detail

Wavelength Dependence of Photostructural Transformations in As2S3 Thin Films

Authors: Kovalskiy Andriy | Vlček Miroslav | Pálka Karel | Golovchak Roman | Jain Himanshu

Year: 2013

Type of publication: článek v odborném periodiku

Name of source: Physics Procedia

Publisher name: Elsevier Science BV

Place: Amsterdam

Page from-to: 75-81

Titles:

Language	Name	Abstract	Keywords
cze	Závislost fotostrukturních změn v tenkých vrstvách As2S3 na vlnové délce	Byla studována spektrální závislost fotostrukturních změn na povrchu a v objemu vakuově napařených tenkých vrstev As2S3 v závislosti osvětlení zářením s energií vyšší, rovnou nebo nižší než je šířka zakázaného pásu materiálu.	chalkogenidová skla; fotoindukované jevy; Ramanova spektroskopie; XPS
eng	Wavelength Dependence of Photostructural Transformations in As2S3 Thin Films	Spectral dependence of photostructural transformations on the surface and in the interior of thermally evaporated As2S3 thin films is studied under the influence of bandgap, sub-bandgap and super-bandgap light. For the given light intensity (W~15 mW/cm2) the irradiation by bandgap and super-bandgap light leads to partial restoration of pyramidal structural units in the film, which is a characteristic of the bulk glasses of this stoichiometric composition. The mechanism of photostructural transformations on the surface of the film exhibits strong spectral dependence. S- rich layer is formed upon irradiation by super-bandgap UV light. The sub-bandgap light does not cause any noticeable photostructural transformations at this light intensity.	chalcogenide glass; photoindused effects; Raman spectroscopy; X-ray photoelectron spectroscopy

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