Publication detail

Study of amorphous thin films of Ge-As-Se system using laser desorption ionisation time-of-flight mass spectrometry

Authors: Švihlová K. | Prokeš L. | Alberti M. | Němec Petr | Havel J.

Year: 2014

Type of publication: ostatní - přednáška nebo poster

Page from-to: nestránkováno

Titles:

Language	Name	Abstract	Keywords
eng	Study of amorphous thin films of Ge-As-Se system using laser desorption ionisation time-of-flight mass spectrometry	Study of amorphous thin films of Ge-As-Se system using laser desorption ionisation time-of-flight mass spectrometry was performed.	mass spectrometry; amorphous chalcogenides; thin films; PLD

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