Publication detail

XPS for the analysis of amorphous chalcogenides-based photosensitive thin films

Authors: Němec Petr | Cardinaud Christophe | Boidin Rémi | Olivier Mélinda | Nazabal Virginie

Year: 2015

Type of publication: ostatní - přednáška nebo poster

Page from-to: nestránkováno

Titles:

Language	Name	Abstract	Keywords
eng	XPS for the analysis of amorphous chalcogenides-based photosensitive thin films	X-ray photoelectron spectroscopy was used for the analysis of amorphous chalcogenides-based photosensitive thin films from Ge-Sb-Se system prepared by pulsed laser deposition.	XPS; thin films; amorphous chalcogenides; pulsed laser deposition

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