University of PardubiceFaculty of Chemical Technology

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Investigation of the resistive switching in AgxAsS2 layer by conductive AFM

Authors: Zhang Bo | Kutálek Petr | Knotek Petr | Macák Jan | Hromádko Luděk | Wágner Tomáš

Year: 2017

Type of publication: ostatní - přednáška nebo poster

Page from-to: nestránkováno

Titles:

Language	Name	Abstract	Keywords
eng	Investigation of the resistive switching in AgxAsS2 layer by conductive AFM	In this poster, a study of resistive switching in AgxAsS2 layer, based on a utilization of conductive atomic force microscope (AFM), is reported. As the result of biasing, two distinct regions were created on the surface (the conductive region and non-conductive region). Both were analyzed from the spread current maps. The volume change, corresponding to the growth of Ag particles, was derived from the topological maps, recorded simultaneously with the current maps. Based on the results, a model explaining the mechanism of the Ag particle and Ag filament formation was proposed from the distribution of charge carriers and Ag ions.	Switching; AgxAsS2; layer; conductive; AFM