Materials synthesis | Tools |
Deposition of thin films | Atomic Layer Deposition tool (TSF 200, Beneq) incl. glovebox and Flow-Bed Reactor |
Atomic Layer Deposition tool (Flexivol, CTechNANO) | |
Chemical Vapor Deposition tool (Vakumservis) | |
Spincoater (Best Tools) | |
Ellipsometer (FS-1, Film Sense) | |
He leak detector (ASM340DRY, Pfeiffer) | |
Fibers | Cyclon 1 (Pardam) including Air-Conditioning unit |
Viscosimeter | |
Vacuum Dryer (D 23, Fisher Scientific) | |
Surface tension analyser | |
Nanodisperse systems incl. separation | Glovebox (MB200MOD, MBraun) |
Spin-coater (WS-650, Laurell) | |
Lyophiliser (L4-110 PRO, Gregor Instruments) | |
Supercritical CO2 dryer (SFE-Helix Basic, Applied Separations) | |
DLS / ZETA sizer (SZ 100 Z, Horiba) | |
Ultracentrifuge (Optima Max XP, Beckmann & Coulter) | |
Ultrasonic homogeniser (Sonopuls HD 4200, Bandelin) | |
Hydrothermal and sol-gel syntheses | Hydrothermal reactor (Multiwave 5000, Anton Paar) |
Rotary evaporator (R-100, Büchi) | |
Vacuum Drying Oven (VD 23, Fisher Scientific) | |
Thermal treatments | Vacuum furnace with controlled atmosphere (VTP1500, VacuumTech) |
Firing three zones furnace (7016T3Z, Classic CZ) | |
Rapid Thermo Annealer (JF 100C, Jipelec) | |
Tube muffle furnace | |
Materials characterization | Tools |
Electron Microscopy | Scanning electron microscopy (JSM 7500F, JEOL Ltd) |
Electron Microscopy +Lithography | Scanning electron microscope + Focused-ion beam lithography (LYRA 3 GMH, TESCAN) |
Energy-dispersive X-ray spectroscopy (Oxford Instruments) | |
Electron-beam lithography (LYRA3 GMH, TESCAN) | |
X-ray photoelectron spectroscopy | X-ray photoelectron spectroscopy (XPS, ESCA 2SR, Scienta Omicron), incl. mono- and dual X-ray source |
X-ray diffractometry | X-ray diffractometry (XRD, Empyrean, Malvern Panalytical) |
Optical spectroscopy | Fourier-transformed Infrared Spectroscopy (FTIR, Vertex 70v+HIPERION 3000 mikroskop, BRUKER) |
UV-VIS-NIR spectrometry with integration sphere (UV3600PLUS + ISR603, SHIMADZU) | |
Raman Spectroscopy (MultiRam, Bruker) | |
Optical measurements | Optical setup with pulse and continual lasers (Q-Smart 450, DPSS SLM, Thorlabs, Newport) |
Fluorometer (PTI QuantaMaster 400, Horiba) | |
Atomic Force Microscopy | Atomic Force Microscope (Ntegra, NT-MDT Spectrum Instruments |
Thermal analyses | Thermal gravimetry-gas chromatography with mass spectrometer (TG-GC-MS, Pyris 1TGA-Clarus 680GC-Clarus SQ8T-MS, PERKIN ELMER) |
Differential Scanning Calorimeter (DSC Q2000, Waters) | |
Sample preparation for analyses | Sputter coater (EM AC 200 Sputter, Leica) |
Sample cutter (EM TXP, Leica) | |
Griding/polishing machine (LaboPol-20, Struers) | |
Plasma Cleaner (HPT-100, Henniker Plasma) | |
Others | Tools |
(Photo)-electrochemistry | Photoelchem setup (Institut Fotonowy) |
Solar simulator (LED based, LSH-7320, Newport) | |
Electrochemical workstations VIONIC (Metrohm) and Zennium Pro (Zahner) | |
Small equipment | Deinozied Water station (Fisher Scientific) |
Optical microscope (DM750M, Leica) | |
Cryostat (Optistat DNV, Oxford Instruments) |