• Dual beam scanning electron microscope with Focused Ion Beam (FIB/SEM, (LYRA3 GMH, TESCAN ORSAY HOLDING, a.s.), equipped with Magnetic Field Cancelling System, Gas Injection System and STEM detector, Energy Dispersive X-ray Diffraction, Electron-beam lithography.
  • Field-emission electron microscope (JSM 7500F, JEOL Ltd)
  • Atomic layer deposition system (TSF 200, BENEQ)
  • X-ray diffractometer (Empyrean, Malvern Panalytical)
  • X-ray photoelectron spectroscope (ESCA 2SR, Scienta Omicron)
  • Vacuum coating system (MPE 600s, PLASSYS BESTEK SAS)
  • Thermal Gravimetry-Gas Chromatograhpy-Mass Spectroscopy setup ((TG-GC-MS, Pyris 1, TGA-Clarus 680GC-Clarus SQ8T-MS, PERKING ELMER)
  • UV-VIS-NIR spectrophotometer (UV3600PLUS + ISR603, SHIMADZU)
  • Flow reactor X-Cube (Microactivity Effi, PID Eng&Tech)
  • Tool for fiber synthesis (Cyclone 1, Pardam)
  • Differential scanning calorimeter (DSC Q2000, WATERS)
  • Glove box (GP (campus) T2+T2, JACOMEX)
  • Micronizer (particle mill, Labomill, PHOOD PHARMA SYSTEM)
  • Optical setup (2x optical table Integrity 2, NewPort, 2 x modular fiber spectrometer AvaSpec3648-USB2, Avantes,  2 ks fiber light source, halogen lamp, deuterium lamp, peripherals,příslušenství)
  • Optical setup composed of pulse and continuous lasers and additional necessary components allowing photonic sintrations and studies of the dependence of the mechanism of light interaction with matter on the energy supplied
  • Optical setup with Xe lamp, monochromator and electrochemical cell for photocurrent measurements (INSTITUT PHOTONOWY)
  • Potentiostat-Galvanostat (PGU 200V, ELEKTRONIKLABOR GmbH)
  • Spincoater with Teflon coated bowl (SC110-S, BEST TOOLS, LLC)
  • Sputter coater of carbon and noble metals (ACE 200, Leica)
  • Tool for sample preparation for microscopies (EM TXP, Leica)
  • He-leak detector for testing of leaks from vacuum setups (ASM340DRY, Pfeiffer Vacuum)
  • Optical microscope (DM750, Olympus)
  • Spincoater (Laurel Technologies Corporation)
  • Tube muffle furnace (Vezas)Voltage source for electrochemical anodizations (Heiden)
  • Rapit thermal annealer (JETFirst100C, Jipelec)
  • Dynamic light scattering analyser  (SZ-100Z, Horiba)
  • Ultracentrifuge for separation of nanomaterials (Optima™ Max- XP, Beckman Coulter)¨
  • Laboratory autoclave with peripherals for work with supercritical CO2 (Labicom)
  • Vacuum oven up to 1500 °C with variable atmospheres (VacuumTech)
  • Lyophilizer (BioTech)
  • FTIR spectrometr (VERTEX 70v, Bruker)
  • FT Raman (MultiRam, Bruker)
  • VIS-NIR Fluorometer PTI QM400 with cryostat chamber (Horriba)
  • Atomic force microscope Ntegra Prima with vacuum chamber (NT-MDT)

 

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