| Materials synthesis | Tools |
| Deposition of thin films | Atomic Layer Deposition tool (TSF 200, Beneq) incl. glovebox and Flow-Bed Reactor |
| Atomic Layer Deposition tool (Flexivol, CTechNANO) | |
| Chemical Vapor Deposition tool (Vakumservis) | |
| Spincoater (Best Tools) | |
| Ellipsometer (FS-1, Film Sense) | |
| He leak detector (ASM340DRY, Pfeiffer) | |
| Fibers | Cyclon 1 (Pardam) including Air-Conditioning unit |
| Viscosimeter | |
| Vacuum Dryer (D 23, Fisher Scientific) | |
| Surface tension analyser | |
| Nanodisperse systems incl. separation | Glovebox (MB200MOD, MBraun) |
| Spin-coater (WS-650, Laurell) | |
| Lyophiliser (L4-110 PRO, Gregor Instruments) | |
| Supercritical CO2 dryer (SFE-Helix Basic, Applied Separations) | |
| DLS / ZETA sizer (SZ 100 Z, Horiba) | |
| Ultracentrifuge (Optima Max XP, Beckmann & Coulter) | |
| Ultrasonic homogeniser (Sonopuls HD 4200, Bandelin) | |
| Hydrothermal and sol-gel syntheses | Hydrothermal reactor (Multiwave 5000, Anton Paar) |
| Rotary evaporator (R-100, Büchi) | |
| Vacuum Drying Oven (VD 23, Fisher Scientific) | |
| Thermal treatments | Vacuum furnace with controlled atmosphere (VTP1500, VacuumTech) |
| Firing three zones furnace (7016T3Z, Classic CZ) | |
| Rapid Thermo Annealer (JF 100C, Jipelec) | |
| Tube muffle furnace | |
| Materials characterization | Tools |
| Electron Microscopy | Scanning electron microscopy (JSM 7500F, JEOL Ltd) |
| Scanning electron microscope (JSM 5500-LV/EDX, JEOL Ltd] | |
| Electron Microscopy +Lithography | Scanning electron microscope + Focused-ion beam lithography (LYRA 3 GMH, TESCAN) |
| Energy-dispersive X-ray spectroscopy (Oxford Instruments) | |
| Electron-beam lithography (LYRA3 GMH, TESCAN) | |
| X-ray photoelectron spectroscopy | X-ray photoelectron spectroscopy (XPS, ESCA 2SR, Scienta Omicron), incl. mono- and dual X-ray source |
| X-ray diffractometry | X-ray diffractometry (XRD, Empyrean, Malvern Panalytical) |
| Micro-X-ray fluorescence spectroscopy | mXRF spectrometer Atlas X (IXRF systems) |
| X-ray fluorescence spectroscopy | ED XRF spectrometer Elva X (Elvatech) |
| Optical spectroscopy | Fourier-transformed Infrared Spectroscopy (FTIR, Vertex 70v+HIPERION 3000 mikroskop, BRUKER) |
| UV-VIS-NIR spectrometry with integration sphere (UV3600PLUS + ISR603, SHIMADZU) | |
| Raman Spectroscopy (MultiRam, Bruker) | |
| FT-IR spectrometer FAR–NEAR IR (Nicolet NEXUS) and optical cryostat (Optistat CF-V) | |
| Optical measurements | Optical setup with pulse and continual lasers (Q-Smart 450, DPSS SLM, Thorlabs, Newport) |
| Fluorometer (PTI QuantaMaster 400, Horiba) | |
| Atomic Force Microscopy | Atomic Force Microscope (Ntegra, NT-MDT Spectrum Instruments |
| AFM / SPM Microscope (Solver PRO-M with digital controller P9, NT-MDT) | |
| Textural analyses | High vacuum gas sorption analyses (Autosorb 6100 FKM, Anton Paar) |
| Thermal analyses | Thermal gravimetry-gas chromatography with mass spectrometer (TG-GC-MS, Pyris 1TGA-Clarus 680GC-Clarus SQ8T-MS, PERKIN ELMER) |
| Differential Scanning Calorimeter (DSC Q2000, Waters) | |
| Thermomechanical analyser (TMA CX 03R) | |
| Electrical and thermoelectrical analyses | Impedance spectrometer (AUTOLAB PGSTAT 12 with modules FRA 2 and ECD) |
| Thermoelectrical analyser (LSR-3 , Linseis) | |
| Sample preparation for analyses | Sputter coater (EM AC 200 Sputter, Leica) |
| Sample cutter (EM TXP, Leica) | |
| Griding/polishing machine (LaboPol-20, Struers) | |
| Plasma Cleaner (HPT-100, Henniker Plasma) | |
| Others | Tools |
| (Photo)-electrochemistry | Photoelchem setup (Institut Fotonowy) |
| Solar simulator (LED based, LSH-7320, Newport) | |
| Electrochemical workstations VIONIC (Metrohm) and Zennium Pro (Zahner) | |
| Small equipment | Deinozied Water station (Fisher Scientific) |
| Optical microscope (DM750M, Leica) | |
| Optical microscope (BX 60, Olympus) | |
| Cryostat (Optistat DNV, Oxford Instruments) | |
| Cryogenic miller Freezer/Mill 6775 (SPEX SamplePrep) |
