Czech Republic

Characterization of nanostructures and optical gratings, small-angle scattering and diffraction

Akademie věd Praha

Characterization of nanostructures and optical gratings

MFF UK Praha
FCh VUT Brno
VŠChT Praha

Layered semiconductors research

CEITEC, Masarykova univerzita Brno
Akademie věd Praha
MFF UK Praha

France

Characterization of nanostructures and optical gratings
GEMAC University of Versailles

Italy

Analysis of polymer materials under high pressure

Dep.Phys.Chem., University of Palermo
Sincrotrone Trieste Elettra

Germany

Thermoelectric materials research
German Aerospace Center, SRN

Austria

Analysis of polymer and biopolymer materials
Institute of Biophysics and X-Ray Structure Research, Austrian Academy of  Sciences, Graz

Spain

Layered semiconductors research
Departamento de Fisica Aplicada, E.T.S. Ingenieria del Diseno, Universitat Politècnica de València, Valencia

USA

Thermoelectric materials research
Dep.Phys., University of Michigan, MI

Small Angle X-Ray Scattering and X-Ray Diffraction
Boston University
Brookhaven National Laboratory

Korean republic

Research of materials for energy storage and supercapacitors and their characterization

Yeungnam University

Great Britain

Research of materials for optical fibers and their characterization

University of Southampton

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