Publikace detail

Spin-coated As33S67-xSex thin ﬁlms: the effect of annealing

Autoři: Kohoutek Tomáš | Wágner Tomáš | Vlček Miroslav | Vlček Milan | Frumar Miloslav

Rok: 2006

Druh publikace: článek v odborném periodiku

Název zdroje: Journal of Non-Crystalline Solids

Název nakladatele: Elsevier Science BV

Místo vydání: Amsterdam

Strana od-do: 1563-1566

Tituly:

Jazyk	Název	Abstrakt	Klíčová slova
cze	Tenké vrstvy systému As33S67-xSex deponované metodou spin-coating: vliv temperace	The spin-coating method was used for the preparation of amorphous chalcogenide As33S67-xSex ﬁlms, where x = 0, 17, 33.5, 50 and 67 at.%. The ﬁlms were stabilized in a vacuum furnace at 70 oC for 10 hours. The compositions of the ﬁlms, established by Energy-Dispersive X-ray analysis, were similar to the composition of the glass used for the preparation of the solutions. The optical transmission measurements indicated that the optical band gap decreases with increasing Se-content in the ﬁlms. Raman spectroscopy showed the ﬁlms structure i.e. As?S bonds at 344 and 376 cm-1, S-rings at 495 cm-1 and appearance of As?Se bonds at 225 cm-1, Se chains at 254 cm-1 and S?Se bonds at 416 cm-1 with increasing Se-content. MIR transmission spectra revealed the presence of solvent residua in spin-coated ﬁlms i.e. N?H bonds at 3395?3300 cm-1, C?H bonds at 2980?2850 cm-1. Further annealing of the ﬁlms (150 oC, 0?60 min) caused decrease of N?H and C?H stretching vibration intensities. Raman spectra showed that the annealed ﬁlms were more structurally ordered in contrast to the as-deposited material. The shift of the ﬁlms optical absorption edge to lower energies was observed during annealing procedure. Potential application of the ﬁlms is expected in optical recording and new types of memories.
eng	Spin-coated As33S67-xSex thin ﬁlms: the effect of annealing	The spin-coating method was used for the preparation of amorphous chalcogenide As33S67-xSex ﬁlms, where x = 0, 17, 33.5, 50 and 67 at.%. The ﬁlms were stabilized in a vacuum furnace at 70 oC for 10 hours. The compositions of the ﬁlms, established by Energy-Dispersive X-ray analysis, were similar to the composition of the glass used for the preparation of the solutions. The optical transmission measurements indicated that the optical band gap decreases with increasing Se-content in the ﬁlms. Raman spectroscopy showed the ﬁlms structure i.e. As?S bonds at 344 and 376 cm-1, S-rings at 495 cm-1 and appearance of As?Se bonds at 225 cm-1, Se chains at 254 cm-1 and S?Se bonds at 416 cm-1 with increasing Se-content. MIR transmission spectra revealed the presence of solvent residua in spin-coated ﬁlms i.e. N?H bonds at 3395?3300 cm-1, C?H bonds at 2980?2850 cm-1. Further annealing of the ﬁlms (150 oC, 0?60 min) caused decrease of N?H and C?H stretching vibration intensities. Raman spectra showed that the annealed ﬁlms were more structurally ordered in contrast to the as-deposited material. The shift of the ﬁlms optical absorption edge to lower energies was observed during annealing procedure. Potential application of the ﬁlms is expected in optical recording and new types of memories.	Spin-coating; Chalcogenides; Optical spectroscopy; FTIR measurements; Raman spectroscopy

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