Publikace detail

Utilization of various atomic force microscopy modes in the study of the layered materials

Rok: 2013

Druh publikace: ostatní - přednáška nebo poster

Strana od-do: nestránkováno

Tituly:

Jazyk	Název	Abstrakt	Klíčová slova
eng	Utilization of various atomic force microscopy modes in the study of the layered materials	There were reviewed a possibilities of the different modes of AFM for the study of the layered materials, processes of the synthesis and exfoliation to the nanosheets for the study of the topography, mechanical and electrical behavior.	atomic force microscopy; material engineering; layered material;

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