Publikace detail

Optical parameters of In-Se and In-Se-Te thin amorphous films prepared by pulsed laser deposition

Rok: 2007

Druh publikace: článek v odborném periodiku

Název zdroje: Journal of Physics and Chemistry of Solids

Název nakladatele: Pergamon-Elsevier Science Ltd.

Místo vydání: Oxford

Strana od-do: 846-849

Tituly:

Jazyk	Název	Abstrakt	Klíčová slova
cze	Optical parameters of In-Se and In-Se-Te thin amorphous films prepared by pulsed laser deposition	The thin films of materials based on In-Se are under study for their applicability in photovoltaic devices, solid-state batteries and phase-change memories. The amorphous thin films of In2Se(3-x)Tex (x =0-1.5) and InSe were prepared by pulsed laser deposition method (PLD) using a KrF excimer laser beam (λ=248 nm, 0.5 J cm-2) from polycrystalline bulk targets. The compositions of films verified by energy-dispersive X-ray analysis (EDX) were close to the compositions of targets. The surfaces of PLD films containing small amount of droplets were viewed by optical and scanning electron microscopy (SEM). The optical properties (transmittance and reflectance spectra, spectral dependence of index of refraction, optical gap, single-oscillator energy, dispersion energy, dielectric constant) of the films were determined. The values of index of refraction increased with increasing substitution of Te for Se in In2Se3 films, the values of the optical gap decreased with increasing substitution of Te for Se in In2Se3 films.
eng	Optical parameters of In-Se and In-Se-Te thin amorphous films prepared by pulsed laser deposition	The thin films of materials based on In-Se are under study for their applicability in photovoltaic devices, solid-state batteries and phase-change memories. The amorphous thin films of In2Se(3-x)Tex (x =0-1.5) and InSe were prepared by pulsed laser deposition method (PLD) using a KrF excimer laser beam (λ=248 nm, 0.5 J cm-2) from polycrystalline bulk targets. The compositions of films verified by energy-dispersive X-ray analysis (EDX) were close to the compositions of targets. The surfaces of PLD films containing small amount of droplets were viewed by optical and scanning electron microscopy (SEM). The optical properties (transmittance and reflectance spectra, spectral dependence of index of refraction, optical gap, single-oscillator energy, dispersion energy, dielectric constant) of the films were determined. The values of index of refraction increased with increasing substitution of Te for Se in In2Se3 films, the values of the optical gap decreased with increasing substitution of Te for Se in In2Se3 films.	Amorphous materials;Chalcogenides;Thin films;Optical properties

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