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Lattice defects in Cu doped Bi2Te3 single crystals
Autoři: Bludská J. | Jakubec I. | Drašar Čestmír | Lošťák Petr | Horák Jaromír
Rok: 2007
Druh publikace: článek v odborném periodiku
Název zdroje: Philosophical Magazine Part B
Název nakladatele: Taylor & Francis Ltd.
Místo vydání: Abingdon
Strana od-do: 325-335
Tituly:
Jazyk Název Abstrakt Klíčová slova
cze Lattice defects in Cu doped Bi2Te3 single crystals Relations between the concentration of free charge carriers and the concentration of Cu atoms were studied on Bi2Te3 single crystals doped by copper in a wide range of the copper concentration with the aim to contribute to the clarification of the existence of inactive Cu ions embedded in the lattice of a Bi2Te3 crystal. We compare the changes in the concentrations of free charge carriers due to Cu-doping from melt with that of induced by electrochemical intercalation of copper. Models of possible defect structures of the Bi2Te3 crystals with admixtures of Cu atoms were proposed both for doped and intercalated single crystals.
eng Lattice defects in Cu doped Bi2Te3 single crystals Relations between the concentration of free charge carriers and the concentration of Cu atoms were studied on Bi2Te3 single crystals doped by copper in a wide range of the copper concentration with the aim to contribute to the clarification of the existence of inactive Cu ions embedded in the lattice of a Bi2Te3 crystal. We compare the changes in the concentrations of free charge carriers due to Cu-doping from melt with that of induced by electrochemical intercalation of copper. Models of possible defect structures of the Bi2Te3 crystals with admixtures of Cu atoms were proposed both for doped and intercalated single crystals. tetradymite-type chalcogenides, Bi2Te3, Cu doping, Cu intercalation, defect structures