Publikace detail

Structural features of spin-coated thin films of binary AsxS100-x chalcogenide glass system

Rok: 2015

Druh publikace: článek v odborném periodiku

Název zdroje: Thin Solid Films

Název nakladatele: Elsevier Science BV

Místo vydání: Amsterdam

Strana od-do: 642-648

Tituly:

Jazyk	Název	Abstrakt	Klíčová slova
cze	Struktura tenkých vrstev binárního AsxS100-x chalkogenidového systému připravených metodou spin-coating	Práce se zabývá strukturou tenkých vrstev binárního AsxS100-x chalkogenidového systému deponovaných metodou spin-coating. Je diskutován mechanismus vazeb mezi organickými rezidui a anorganickou matricí - interakce mezi S ionty a amínovými klastry.
eng	Structural features of spin-coated thin films of binary AsxS100-x chalcogenide glass system	Spin-coating technology offers a convenient method for fabricating photostable chalcogenide glass thin films that are especially attractive for applications in IR optics. In this paper we report the structure of spin-coated AsxS100 (-) (x) (x = 30, 35, 40) thin films as determined using high resolution X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy, especially in relation to composition (i.e. As/S ratio) and preparation process variables. It was observed that As atoms during preparation have a tendency to precipitate out in close to stoichiometric compositions. The mechanism of bonding between the inorganic matrix and organic residuals is discussed based on the experimental data. A weak interaction between S ions and amine-based clusters is proposed as the basis of structural organization of the organic-inorganic interface.	Spin-coated films; Chalcogenide glass; X-ray photoelectron spectroscopy; Raman spectroscopy

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