Univerzita Pardubice Fakulta chemicko- technologická

Univerzita Pardubice

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Publikace detail

Investigation of the resistive switching in AgxAsS2 layer by conductive AFM

Autoři: Zhang Bo | Kutálek Petr | Knotek Petr | Macák Jan | Hromádko Luděk | Wágner Tomáš

Rok: 2017

Druh publikace: ostatní - přednáška nebo poster

Strana od-do: nestránkováno

Tituly:

Jazyk	Název	Abstrakt	Klíčová slova
eng	Investigation of the resistive switching in AgxAsS2 layer by conductive AFM	In this poster, a study of resistive switching in AgxAsS2 layer, based on a utilization of conductive atomic force microscope (AFM), is reported. As the result of biasing, two distinct regions were created on the surface (the conductive region and non-conductive region). Both were analyzed from the spread current maps. The volume change, corresponding to the growth of Ag particles, was derived from the topological maps, recorded simultaneously with the current maps. Based on the results, a model explaining the mechanism of the Ag particle and Ag filament formation was proposed from the distribution of charge carriers and Ag ions.	Switching; AgxAsS2; layer; conductive; AFM